@book{12831,
	author = {Shwop, John E., and United States. and Conference on Reliability of Semiconductor Devices},
	title = {Semiconductor reliability /},
	publisher = {Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York},
	year = {c1961.},
	address = {Elizabeth, N.J. :},
	note = {Vol. [1]: Based on the Conference on Reliability of Semiconductor Devices, 1961, sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense. Edited by John E. Shwop [and] Harold J. Sullivan.}
}