00966cam a2200265u  45000010008000000030008000080050017000160080041000330100017000740400028000910500019001190820016001381000035001542450093001892600043002823000037003253650016003625000020003786500028003987000053004269060045004799420012005249990017005369520147005538491446BD-DhUL20140924112832.0820521s1968    nyua          000 0 eng    a   68017577   aDLCcCarPdDLCdBD-DhUL00aTN686.5.M5bB4  a537.56bBEE1 aBelk, J. A. [from old catalog]10aElectron microscopy and microanalysis of metals /cedited by J. A. Belk and A.L. Davies.  aAmsterdam :bElsevier Pub. Co.,c1968.  aix, 254 p. : c23 cm.b illus. ;  aBDTb165.00  aIncludes index. 0aElectron metallography.1 aDavies, A. L., [from old catalog]ejoint author.  a0bcbccpremunvduencipf19gy-gencatlg  2ddccBK  c12695d12695  00102ddc406537_560000000000000_BEE708NFIC922705aDUSLbDUSLcGENd2014-09-24ePurchasedo537.56 BEEpA129870r2014-09-24w2014-09-24yBK