proceedings of the 20th international congress, Karlsruhe, Germany, 15-18 September 2009 International Congress on X-ray Optics and Microanalysis 2009 : Karlsruhe, Germany) creator Denecke, Melissa A. Walker, Clive T. text bibliography conference publication nyu Melville, N.Y American Institute of Physics 2010 monographic eng

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xiv, 214 p. : ill. ; 28 cm. Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques. editors, Melissa A. Denecke, Clive T. Walker ; sponsoring organizations, Research Center Karlsruhe (FZK)-Program NUCLEAR ... [et al.]. "All papers have been peer reviewed." "This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix. Includes bibliographical references and index. X-ray optics Congresses Materials Microscopy Congresses X-ray microanalysis Congresses X-ray microscopes Congresses TA1775 .I582 2009 537.5352 INI 9780735407640 0735407649 2011499270 YDXCP 111011 20150204130452.0 16994592