01995cam a2200385 a 4500 16994592 BD-DhUL 20150204130452.0 111011s2010 nyua b 101 0 eng c 2011499270 9780735407640 0735407649 (OCoLC)ocn624405748 YDXCP YDXCP YUS NTE PIT IQU DLC BD-DhUL pcc TA1775 .I582 2009 537.5352 INI International Congress on X-ray Optics and Microanalysis (20th : 2009 : Karlsruhe, Germany) X-ray optics and microanalysis : proceedings of the 20th international congress, Karlsruhe, Germany, 15-18 September 2009 / editors, Melissa A. Denecke, Clive T. Walker ; sponsoring organizations, Research Center Karlsruhe (FZK)-Program NUCLEAR ... [et al.]. Melville, N.Y. : American Institute of Physics, 2010. xiv, 214 p. : ill. ; 28 cm. AIP conference proceedings, 0094-243X ; 1221 "All papers have been peer reviewed." "This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix. Includes bibliographical references and index. Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques. X-ray optics Congresses. Materials Microscopy Congresses. X-ray microanalysis Congresses. X-ray microscopes Congresses. Denecke, Melissa A. Walker, Clive T. AIP conference proceedings ; no. 1221. ddc BK 12639 12639 0 0 ddc 0 537_535200000000000_INI 0 NFIC 22632 DUSL DUSL GEN 1976-08-04 Gift 537.5352 INI A140576 2014-09-24 2014-09-24 BK