X-ray optics and microanalysis : proceedings of the 20th international congress, Karlsruhe, Germany, 15-18 September 2009 - International Congress on X-ray Optics and Microanalysis 2009 : Karlsruhe, Germany); Denecke, Melissa A.; Walker, Clive T. (Melville, N.Y. : American Institute of Physics, 2010)
Advances in instrumentation, detection, and methodology -- X-ray optics monochromators and multilayers, focusing optics -- Quantitative and multivariate analysis -- Imaging techniques and image processing -- Applications of nano-, micro-, and surface analysis techniques.
"All papers have been peer reviewed."
"This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix.
Includes bibliographical references and index.
Keywords: X-ray optics -- Congresses; Materials -- Microscopy -- Congresses; X-ray microanalysis -- Congresses; X-ray microscopes -- Congresses