<?xml version="1.0" encoding="UTF-8"?>
<metadata
  xmlns="http://example.org/myapp/"
  xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"
  xsi:schemaLocation="http://example.org/myapp/ http://example.org/myapp/schema.xsd"
  xmlns:dc="http://purl.org/dc/elements/1.1/"
  xmlns:dcterms="http://purl.org/dc/terms/"><dc:Title>X-ray optics and microanalysis : proceedings of the 20th international congress, Karlsruhe, Germany, 15-18 September 2009 / editors, Melissa A. Denecke, Clive T. Walker ; sponsoring organizations, Research Center Karlsruhe (FZK)-Program NUCLEAR ... [et al.].</dc:Title>
<dc:Creator>International Congress on X-ray Optics and Microanalysis (20th : 2009 : Karlsruhe, Germany)</dc:Creator>
<dc:Creator>Denecke, Melissa A.</dc:Creator>
<dc:Creator>Walker, Clive T.</dc:Creator>
<dc:Subject>X-ray optics Congresses.</dc:Subject>
<dc:Subject>Materials Microscopy Congresses.</dc:Subject>
<dc:Subject>X-ray microanalysis Congresses.</dc:Subject>
<dc:Subject>X-ray microscopes Congresses.</dc:Subject>
<dc:Subject>TA1775 .I582 2009</dc:Subject>
<dc:Subject>537.5352 INI</dc:Subject>
<dc:Description>"All papers have been peer reviewed."</dc:Description>
<dc:Description>"This book contains peer-reviewed proceeding contributions to the 20th International Congress on X-ray Optics and Microanalysis, ICXOM20, held in Karlsruhe, Germany, from the 15th to the 18th of September 2009"--P. ix.</dc:Description>
<dc:Description>Includes bibliographical references and index.</dc:Description>
<dc:Publisher>Melville, N.Y. : American Institute of Physics,</dc:Publisher>
<dc:Date>2010.</dc:Date>
<dc:Date>2010.</dc:Date>
<dc:Date>2010</dc:Date>
<dc:Type>Text</dc:Type>
<dc:Format>xiv, 214 p. :</dc:Format>
<dc:Language>eng</dc:Language>
<dc:Relation>AIP conference proceedings, 0094-243X ; 1221</dc:Relation>
<dc:Relation>AIP conference proceedings ; no. 1221.</dc:Relation>

</metadata>