TY  - BOOK
AU  - Ahuja, Narendra,
AU  - Schachter, Bruce J.
TI  - Pattern models
SN  - 0471861944
U1  - 001.434 19
PY  - 1983///
CY  - New York
PB  - Wiley
KW  - Pattern recognition systems
KW  - Image processing
KW  - Geometrical models
N1  - "A Wiley-Interscience publication."; Includes bibliographical references and indexes
ER  -