TY  - BOOK
AU  - Birkholz, Mario.
AU  - Fewster, Paul F.
AU  - Genzel, Christoph.
TI  - Thin film analysis by X-ray scattering
SN  - 3527310525
AV  - QC176.83 .B57 2006
U1  - 530.4275 22
PY  - 2006///
CY  - Weinheim
PB  - Wiley-VCH
KW  - Thin films
KW  - X-ray spectroscopy
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/enhancements/fy0653/2006482582-b.html
UR  - http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html
ER  -