01559cam a22004217a 4500 14539256 BD-DhUL 20140917102026.0 060907s2006 gw a b 001 0 eng d 2006482582 013206703 Uk 3527310525 9783527310524 (CStRLIN)NYUGB13271031-B (NNU)NYUb13271031 (NYU)NYUb13271031 (OCoLC)ocm62470788 UKM UKM TXH IXA BAKER DLC BD-DhUL lccopycat QC176.83 .B57 2006 530.4275 22 BIT Birkholz, Mario. Thin film analysis by X-ray scattering / Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel. Weinheim : Wiley-VCH, c2006. xxii, 356 p. : ill. ; 25 cm. US$ 185 Includes bibliographical references and index. Thin films. X-ray spectroscopy. Fewster, Paul F. Genzel, Christoph. Contributor biographical information http://www.loc.gov/catdir/enhancements/fy0653/2006482582-b.html Publisher description http://www.loc.gov/catdir/enhancements/fy0653/2006482582-d.html Table of contents only http://www.loc.gov/catdir/enhancements/fy0653/2006482582-t.html 7 cbc copycat 2 ncip 20 y-gencatlg ddc BK of25 2006-09-07 z-processor to ASCD jx00 2006-09-13 jx85 2006-09-20 11088 11088 0 0 ddc 0 530_427500000000000_BIT 0 NFIC 19834 DUSL DUSL GEN 2010-07-13 Purchased 530.4275 BIT 451078 2014-09-17 2014-09-17 BK