Computed electron micrographs and defect identification.
by Head, A. K.
Material type:
BookSeries: Defects in crystalline solids, v. 7. Publisher: Amsterdam, North-Holland Pub. Co., 1973Description: x, 400 p. with illus. 23 cm.ISBN: 0444104623 (American Elsevier).Subject(s): Metals -- Defects -- Data processing | Electron microscopy -- Data processing
| Item type | Current location | Collection | Call number | Status | Date due | Barcode |
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Books
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Dhaka University Science Library General Stacks | Non Fiction | 544.82 HEC (Browse shelf) | Available | A169815 |
Bibliography: p. [387]-389.
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