Thin film analysis by X-ray scattering /
by Birkholz, Mario; Fewster, Paul F; Genzel, Christoph.
Material type:
BookPublisher: Weinheim : Wiley-VCH, c2006Description: xxii, 356 p. : ill. ; 25 cm.ISBN: 3527310525; 9783527310524.Subject(s): Thin films | X-ray spectroscopyOnline resources: Contributor biographical information | Publisher description | Table of contents only
| Item type | Current location | Collection | Call number | Status | Date due | Barcode |
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Dhaka University Science Library General Stacks | Non Fiction | 530.4275 BIT (Browse shelf) | Available | 451078 |
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| 530.42 ROL Liquids and liquid mixtures / | 530.42 SIM Simulation of liquids and solids : | 530.42 UEF Fundamentals and new frontiers of Bose-Einstein condensation / | 530.4275 BIT Thin film analysis by X-ray scattering / | 530.429 GEP The physics of liquid crystals / | 530.429 NEP The physics of lyotropic liquid crystals : | 530.43 MCM The mobility and diffusion of ions in gases |
Includes bibliographical references and index.
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