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Flegler, Stanley L.

Scanning and transmission electron microscopy : an introduction / by Stanley L. Flegler, John W. Heckman, Jr. and Karen L. Klomparens. - New York : Oxford University Press, 1993. - viii, 225 p. : ill. ; 26 cm.

Originally published: New York : W.H. Freeman, c1993.

Includes bibliographical references and index.

0195107519 (acidfree paper) 9780195107517

95039017


Scanning electron microscopy.
Transmission electron microscopy.

QH212.S3 / F58 1995

502.825 / FLS
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