Benninghoven, A.
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner. - New York : J. Wiley, 1987. - xxxv, 1227 p. : ill. ; 24 cm. - Chemical analysis ; v. 86 .
"A Wiley-Interscience publication." Includes index.
Bibliography: p. 1125-1216.
0471010561
86011014
Secondary ion mass spectrometry.
QD96.S43 / B46 1987
543.0873 / BES
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner. - New York : J. Wiley, 1987. - xxxv, 1227 p. : ill. ; 24 cm. - Chemical analysis ; v. 86 .
"A Wiley-Interscience publication." Includes index.
Bibliography: p. 1125-1216.
0471010561
86011014
Secondary ion mass spectrometry.
QD96.S43 / B46 1987
543.0873 / BES